Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction
نویسندگان
چکیده
منابع مشابه
Electron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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College of Engineering, Swansea University, Centre for Solar Energy Research, UK Department of Electronic Engineering, University of Surrey, UK Department of Mathematics, Physics, and Electrical Engineering, Northumbria University, UK Advanced Technology Institute, University of Surrey, UK Qioptiq Ltd, Qioptiq Space Technology, UK Correspondence Dan A. Lamb, Centre for Solar Energy Research, Co...
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The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM. EBSD provides quantitative microstructural information about the crystallographic nature of metals, minerals, semiconductors, and ceramics—in fact most inorganic crystalline materials. It reveals grain size, grai...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2010
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927610058253